Quality control in chip fabrication is taking a turn towards automation with advanced visual inspection solutions emerging.
FREMONT, CA: The semiconductor industry is on the rise; demands are skyrocketing, and applications are diversifying. This is pushing chip manufacturers to adopt new approaches and technologies. Defect detection, which is one of the key areas of chip fabrication, is also undergoing makeovers. Effective defect detection brings down delays and boosts yields. Thus, the use of the latest technologies, like visual detection and artificial intelligence carry a lot of relevance now. The ability to visually determine defects in chip design is helping the semiconductor industry transform in the following ways.
• Efficient Wafer Inspections
Visual inspection solutions allow chip designers to detect defects through wafer maps and microscope images. While a wafer map can demonstrate the performance of a semiconductor chip, the microscope images allow close inspections of the wafer. The defects can then be classified to arrive at a better understanding. Subsequently, the defects can be fixed at the earliest and allow manufacturers to prevent such defects from repeating in the future.
• Effective Automation
The combination of the visual defect detection system and artificial intelligence brings about new opportunities for efficient chip inspection. Today, it is possible to automate chip defect detection using AI-backed solutions. Chip manufacturers can train defect detection solutions with sample defects and allow the machine to carry out accurate inspections. Many technology vendors have been able to deliver high degrees of accuracy with their automated defect detection tools. With automated processes of detection, chip manufacturers can reduce dependence on manual efforts and expedite fabrication.
• Hassle-free Quality Control
Manual processes that do not leverage visual data result in limitations. Achieving consistency with such an approach also becomes difficult. On the other hand, automated visual defect detection ensures the highest standards of quality control. Reporting the defects also becomes comprehensive since images are used.
Capturing details regarding defects and verifying chip design through visual techniques is allowing the surging semiconductor industry to maintain momentum in production.
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