Contributors

Agile Development of AI Defect Detection Using CNN

• Marco Chan, VP of Technology, Wise Ally Holdings Limited

Shaping The Future Of Manufacturing With Artificial Intelligence

• Dr Hans-Jurgen Braun, Senior Vice President, Operations, Vitesco Technologies (ETR: VTSC)

Instilling Operational Excellence In Your Company

• Luc Roesems, Vice President of Manufacturing, Samsonite

Hardware is Key to Stronger, More Scalable Security

• Steve Orrin, Federal CTO and Senior Principal Engineer, Intel

The Future of Machine Vision and How to be ready for that Future

• Paul Chen, Sr. Director, Electronic Design, Mattel

Increased Semiconductor Yields and Process Reliability Demand Precise Plasma Power Control and Insight Advanced power technologies for single-and dual-magnetron sputtering

• Dhaval Dhayatkar, Senior Director, Plasma Power Products, Advanced Energy

The Semiconductor Market has Changed almost beyond Recognition

• Scott D’Cruze, Global Supplier Account Manager, Newark Electronics

New Platform for Multimodal Spectroscopic Characterization of Semiconductors

• Francis C. Ndi, Product Line Manager, Horiba

Our Wireless World: How Wi-Fi 6 will seamlessly Integrate with 5G to Help Keep us Connected

• David Haynes, Vice President, Specialty Technologies for Lam Research's Customer Support Business Group (CSBG)

How IP brings technological innovation to life

• Kristof Beets, Vice President of Technology Insights, Imagination Technologies