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<news:publication_date>2019-04-18</news:publication_date>
<news:title>Why Low-Power FPGA Solution is Ideal for IoT Applications</news:title>
</news:news>
</url>
<url><loc>https://www.semiconductorreview.com/news/how-innovative-approaches-upgrade-testing-and-measurement-processes--nwid-116.html</loc>
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<news:name>Semiconductor Review</news:name>
<news:language>en</news:language>
</news:publication>
<news:publication_date>2000-08-05</news:publication_date>
<news:title>How Innovative Approaches Upgrade Testing and Measurement Processes </news:title>
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