The pace of technical innovation, development, and adoption is continuing to accelerate. New emerging technologies are disrupting industries and approaches to test and measurement. And new technologies are being developed more quickly than ever before.
Last year the cellular industry began to roll out 5G networks and phones to the global market, and we are ramping up the deployment of 5G mmWave. This network's full deployment will realize many of the promises presented for 5G years ago. However, in the midst of this, researchers and technologists worldwide are already starting to map out what 6G could look like.
It's no secret that industry leaders are racing to be first to market with their products. But if they don't take the time to ensure quality and reliability, they will encounter issues down the road that could be detrimental to their business. Many semiconductor companies feel this tension creating economic and organizational challenges. They can start addressing these challenges by testing more and expanding test into design, characterization, and production test phases. But this means finding a balance between cost and development time. But what if we can imagine product performance and reliability data being captured early and often? What if we were able to capture product use data, identify common failure modes, and use that to influence measurements done during product characterization? That vision is within reach!